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Mô tả sản phẩm
The XT H 225 ST is a Computed Tomography (CT) system ideally suited to a wide range of materials and sample sizes, especially those that are too large or heavy for other systems in the range. The system has three interchangeable sources; the 225 kV reflection target, 180 kV transmission target and the optional 225 kV rotating target. Combined with the wide range of flat panel detectors to choose from, the ST system provides a flexible tool for quality laboratories, production facilities and research departments.
Microfocus source | Max. kV | Max. power | Focal spot size | Focal spot size at max power |
---|---|---|---|---|
180kV Transmission target | 180 kV | 10 W | 1 µm up to 3 W | 10 µm at 10 W |
225 kV Reflection target | 225 kV | 225 W | 3 µm up to 7 W | 225 µm at 225 W |
225 kV Rotating target option | 225 kV | 450 W | 10 µm up to 30 W | 113 µm at 450 W |
Detectors | # Bits | Active pixels | Pixel Size | Max. frame rate at 1x1 binning |
Max. frame rate at 2x2 binning |
---|---|---|---|---|---|
Varian 2520 | 14-bit | 1900 x 1516 | 127 µm | 7.5 fps | 15 fps |
Varian 4030 | 14-bit | 2300 x 3200 | 127 µm | 3 fps | 7 fps |
Perkin Elmer 0820 | 16-bit | 1000 x 1000 | 200 µm | 7.5 fps | 15 fps |
Perkin Elmer 1620 | 16-bit | 2000 x 2000 | 200 µm | 3.75 fps | 7.5 fps |
Perking Elmer 1621 EHS | 16-bit | 2000 x 2000 | 200 µm | 15 fps | 30 fps |
Manipulator | |
---|---|
# Axes | 5 |
Axes travel | (X) 450 mm (Y) 350 mm (Z) 750 mm (Tilt) +/- 30 (Rotate) n*360° |
Max. sample weight | 50kg |
General | |
---|---|
Cabinet dimensions (LxWxH) | 2,414 mm x 1,275 mm x 2,202 mm |
Weight | 4,200 kg |
Safety | All systems are manufactured to IRR99 |
Control software | All systems are controlled by Nikon Metrology’s in-house Inspect-X software |