- Giỏ hàng chưa có sản phẩm
Danh mục:
NikonTừ khóa:
Vận chuyển giao hàng toàn quốc
Phương thức thanh toán linh hoạt
Gọi ngay 0974692294 để mua và đặt hàng nhanh chóng
Mô tả sản phẩm
XT H 320 for X-ray and CT inspection of larger samples
The XT H 320 features a more powerful microfocus X-ray source that is able to run highly accurate inspection on dense industrial objects. Nikon Metrology is the only company to produce 320kV microfocus X-ray sources. As the X-ray spot size of these sources is orders of magnitude smaller compared to minifocus sources, end users benefit from superior resolution, accuracy and a wider array of measurable parts.
With the optional rotation reflection target, an even higher X-ray flux is available enabling customers to obtain faster CT data acquisition or achieve higher CT data accuracy in the same time span.
Categories: Computed Tomography
Applications: Metal corrosion mechanisms, Unveiling mysteries of nature, Implant research, Aircraft Component Inspection, Composites, Automotive Components Inspection, Rocks/Minerals, Plastic Manufacturing, Metallurgy, Implants/ Protheses, Streamlining vehicle pre-production, Household appliances and white goods , Metal Manufacturing, Cosmetics, Die and Mould Applications, Automated measurement, Critical assemblies of medical devices or drug delivery systems, Dental applications, Cracks and Failure Analysis, Manual examination, Damage propagation in composite material, Mobile phones, shavers & watches
Microfocus source | Max. kV | Max. power | Focal spot size | Focal spot size at max power | XT H 320 |
---|---|---|---|---|---|
225 kV Reflection target | 225 kV | 225 W | 3 µm up to 7 W | 225 µm at 225 W | |
225 kV Rotating target option | 225 kV | 450 W | 10 µm up to 30 W | 113 µm at 450 W | |
320 kV Reflection target | 320 kV | 320 W | 30 µm up to 30 W | 300 µm at 320 W |
Basic configuration | |
Alternative configuration |
Detectors | # Bits | Active pixels | Pixel Size | Max. frame rate at 1x1 binning | Max. frame rate at 2x2 binning |
---|---|---|---|---|---|
Varian 2520 (1) | 14-bit | 1900 x 1516 | 127 µm | 7.5 fps | 15 fps |
Perkin Elmer 0820 | 14-bit | 1000 x 1000 | 200 µm | 7.5 fps | 15 fps |
Perkin Elmer 1620 | 16-bit | 2000 x 2000 | 200 µm | 3.75 fps | 7.5 fps |
Perkin Elmer 1621 EHS | 16-bit | 2000 x 2000 | 200 µm | 15 fps | 30 fps |
Combination PE162x & CLDA |
Configuration with both Flat panel and Curved Linear Diode Array detector |
(1) only with 225 kV source
Manipulator | |
---|---|
# Axes | 4 (optional 5th axis) |
Axes travel | (X) 510 mm (Y) 610 mm (Z) 800 mm (Rotate) n*360 |
Max. sample weight | 100kg |
General | |
---|---|
Cabinet dimensions (LxWxH) | 2,695 mm x 1,828 mm x 2,249 mm |
Weight | 8,000 kg |
Safety | All systems are manufactured to IRR99 |
Control software | All systems are controlled by Nikon Metrology’s in-house Inspect-X software |