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Mô tả sản phẩm
XT H 225 for all-purpose X-ray and CT inspection
The entry-level XT H 160 and the versatile XT H 225 systems offer a microfocus X-ray source, a large inspection volume, high image resolution and are ready for ultrafast CT reconstruction. They cover a wide range of applications, including the inspection of plastic parts, small castings and complex mechanisms as well as researching materials and natural specimens.
| Microfocus source | Max. kV | Max. power | Focal spot size | Focal spot size | XT H 160 | XT H 225 |
|---|---|---|---|---|---|---|
| 160 kV Reflection target | 160 kV | 225 W | 3 µm up to 7 W | 225 µm at 225 W | ||
| 180 kV Transmission target | 180 kV | 20 W | 1 µm up to 3 W | 20 µm at 20 W | ||
| 225 kV Reflection target | 225 kV | 225 W | 3 µm up to 7 W | 225 µm at 225 W |
| Detectors | # Bits | Active pixels | Pixel Size | Max. frame rate at 1x1 binning |
Max. frame rate at 2x2 binning |
XT H 160 | XT H 225 |
|---|---|---|---|---|---|---|---|
| Varian 1313Dx | 16-bit | 1000 x 1000 | 127 µm | 30 fps | 60 fps | ||
| Varian 2520Dx | 16-bit | 1900 x 1500 | 127 µm | 12.5 fps | 30 fps | ||
| Varex 4343 | 16-bit | 2880 2880 | 150 µm | 15 fps | 30 fps | ||
| Perkin Elmer 0820 | 16-bit | 1000 x 1000 | 200 µm | 7.5 fps | 15 fps |
: Basic configuration
: Alternative configuration
| Manipulator | XT H 160/ XT H 225 |
|---|---|
| # Axes | 5 |
|
Axes travel (Typical values - Exact values depend on system configuration) |
(X) 185 mm (Y) 250 mm (Z) 625 mm (Tilt) +/- 30 (Rotate) n*360° |
| Max. sample weight | 15 kg |
| General | |
|---|---|
| Cabinet dimensions (LxWxH) | 1,830 mm x 875 mm x 1,987 mm |
| Weight | 2,400 kg |
| Safety | All systems are manufactured to IRR99 |
| Control software | All systems are controlled by Nikon Metrology’s in-house Inspect-X software |
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