Kính hiển vi điện tử quét phát xạ trường Schottky HITACHI SU5000

Overview

The SU5000 FE-SEM has forever changed SEM operations. Ground-breaking computer-assisted technology from Hitachi, referred to as the EM Wizard, offers a new level of SEM operation and control. Expert or novice, the result is now the same: Highest quality nano-scale images at everyone's fingertips!

Watch this 6-min video and see how the SU5000 and
EM Wizard work together!

Features

• A novel, revolutionary user interface, EM Wizard, provides all users with optimum levels of resolution, repeatability, and throughput. With EM Wizard, beginners become experts overnight.
• Automatic axis adjustment technology (auto-calibration) restores the microscope to its "best condition" on demand.
• A robust "draw-out" specimen chamber accommodates large specimens (-200 mmφ, -80 mmH).
• Rapid sample exchange with evacuation to observation in 3 minutes or less.
• Automated, intuitive on-demand image optimization on the fly.
• A visual and interactive guide offers 'pick and choose' SEM modes to ensure best operating conditions.
• With the 3D MultiFinder tool, samples are easily tilted and rotated with the image remaining centered and in focus.

Application data

Life SciencesMaterials ScienceSemiconductors

Life Sciences

Frontal Cortex of Rat

Specimen courtesy of Professor Kubota, NIPS, Japan

Rat Dorsal Root Ganglion Neuron

Specimen courtesy of
Dr. Ushiki and Dr. Koga^(*), Niigata University

*:Asahikawa Medical University

Materials Science

Multi-Walled Carbon Nanotube Outer Structure

Neodymium Magnet

Multiple angle information from a newly developed annular Backscatter Electron Detector (BSD) acquires both topographic and compositional information simultaneously.

Specimen courtesy of Daido Steel.

In-situ Imaging and the Use of a Heating Stage in the Specimen Chamber

Specimen: Gold thin film on quartz substrate
HV=10 kV

Specimen courtesy of Dr. Yoshino and Dr. Terano, Tokyo institute of technology

3D analysis ; Lithium Ion Battery Material

3D re-constructed image of active material (orange) and PvdF (blue) distribution.

Semiconductors

Images of Atomic Step and Threading Dislocation of n-GaN on Si

Specimen courtesy of Professor Egawa,
Research Center for Nano-Device and System
Nagoya Institute of technology, Japan